X-ray ptychography imaging at ESRF
Description
One of the two FAME-PIX (French Absorption spectroscopy beamline in Material and Environmental science – Ptychography Imaging with X-ray) instruments will be dedicated to X-ray ptychography imaging. This instrument will be open to users in 2026, once the entire line has been refurbished. Using the coherence of the X-ray beam, the instrument will enable 2D and 3D imaging of a sample with a spatial resolution well below the beam size (the target resolution will be of the order of 50 nm).
Location
ESRF, beamline BM30
Contacts
Platform manager: Jean-Louis HAZEMANN
Associated targeted project coordinators: Etienne BUSTARRET, Nathalie BOUDET
Technical characteristics
- Source: Bending magnet
- Main optical elements:
- 1st collimating mirror (Rh-coated Si mirror),
- 2-crystal monochromator (Si220, 1st crystal cooled with liquid nitrogen, 2nd crystal focusing horizontally),
- 2nd focusing mirror (Rh-coated Si mirror)
- Secondary optical elements: Kirkpatrick-Baez geometry mirrors (Pd-coated Si mirrors)
- Beam characteristics on sample: 5×5 µm2 (FWHM)
- Detector: fast 2D detector
Associated targeted project
ESRF
Accelerated X-ray Characterization of Materials at the French CRD beamlines of the ESRF